National Instruments (News - Alert) recently announced that its PXIe-5632 VNA PXI vector network analyzer has been effectively optimized to address the growing complexities of RF testing. The PXIe-5632 VNA PXI vector network analyzer can now support RF testing at a substantially reduced cost, size, and time as opposed to the legacy rack-and-stack solutions. National Instruments specializes in helping engineers and scientists transform systems for measuring, automating and embedding applications.
The latest offering from National Instruments has been built on a dual-source architecture sporting frequency ranges of 300 kHz to 8.5GHz in addition to independently tuned sources and source access loops capable of supporting a wide range of measurement applications. Also included are two-port, 3-slot PXI Express VNA, which provides frequency coverage of 300 kHz to 8.5GHz.
The full-featured vector network analyzer now delivers a small PXI footprint. By leveraging the NI PXIe-5632, users will be able to add network analysis in design validation and production lines in a cost-effective way without the large footprint delivered by traditionally used network analyzers. The NI PXIe-5632 vector network analyzer can be used to measure device magnitude, phase, and impedance. Also because the network analyzer is a closed stimulus-response system, it allows for accurate measurement of RF characteristics.
The robust and flexible architecture of the NI PXIe-5632 delivers a low latency trigger for enhanced isolation, and performance, and optimized measurement capabilities. The full-feature soft front panel has been included to allow precision automatic and manual calibrations and enable users to take measurements much faster while the NI LabVIEW and LabWindows/CVI APIs enable parallel testing of multiple RF components.
Specification of the NI PXIe-5632 are as follows – a frequency range of 300 kHz to 8.5 GHz; a bandwidth of 10 Hz to 500 kHz IF; >110 dB dynamic range; -30 to +15 dBm (News - Alert) source power range; and twin sources with independent frequency and power tuning.
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Edited by Brooke Neuman